Sequential Testing

The Test Vector feature supports both combinational and sequential circuit testing. By default, tests are combinational: the circuit is reset before each test, ensuring each test is independent.

For sequential circuits, you can specify test sequences using the special <set> and <seq> header columns:

Here is an example of a sequential test vector:

# Sequential test for a counter
Clock Reset Count <set> <seq>
0     0     0     1     1
1     0     0     1     2
0     0     1     1     3
1     0     1     1     4
0     0     2     1     5
1     0     2     1     6
0     1     0     2     1

In this example, the first six tests all have <set> 1 with <seq> values 1-6, so they form one sequence that runs in order (seq 1, then 2, then 3, etc.) without resetting between steps. The last test has <set> 2, so it starts a new sequence and the circuit is reset before it runs.

Note also that Clock could be an input pin here. But it could also be a labeled clock component (see below).

Sequence Execution Rules

Using the Clock

In a sequential test, the first step begins with a reset. In every step after the first, it begins with a simulation tick. Any Clock components in the simulation will be updated by that tick and their signals will be propagated along with any input pin values for that step. You may add a column to the test to show the ticks. The column will be checked against the clock in the circuit as if it were an output pin to verify it describes the clocks behavior. Here is an example for a simple positive edge-triggered D flip-flop test with a standard clock:

<clk> D Q NotQ  <set> <seq>
  0   0 0   1     1     1
  1   0 0   1     1     2
  0   1 0   1     1     3
  1   1 1   0     1     4
  0   1 1   0     1     5
  1   1 1   0     1     6
  0   0 1   0     1     7

The <clk> header is a special name for an unlabeled clock component. You may also label the clock and use the label as the column header (see earlier example).

We recommend that when using a Clock, you should not change the values of memory inputs during the same step that the clock makes a triggering transition. Doing so may allow an input signal to reach the component at near the same time as the clock signal giving surprising behavior. In the example above, the D input does not change in steps with a rising edge of the clock.

Complete Example

Here is a complete example combining all features:

# Mixed combinational and sequential tests
A B C Out     <clk> <set> <seq>
0 0 0 0       0     0     0
0 0 1 1       0     0     0
1 1 0 1       0     1     1
0 1 0 0       1     1     2
1 1 1 1       0     1     3
0 0 0 <DC>    0     2     1
1 0 1 <float> 1     2     2

In this example:

Thus the execution might look like this:

  1. Reset, set A=0, B=0, C=0 and check that Out==0 and clk=0
  2. Reset, set A=0, B=0, C=1 and check that Out==1 and clk=0
  3. Reset, set A=1, B=1, C=0 and check that Out==1 and clk=0
  4. Tick, set A=0, B=1, C=0 and check that Out==0 and clk=1
  5. Tick, set A=1, B=1, C=1 and check that Out==1 and clk=0
  6. Reset, set A=0, B=0, C=0 and not check Out but clk=0
  7. Tick, set A=1, B=0, C=1 and check that Out is floating (in Logisim this is notated as U) and clk=1
  8. Test Vector is complete

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